检验标准f002004adnswbh-01greva20140217.pdf

Confidential Document Page: 20 / 25 10.2 Inspection condition 10.2.1 Inspection conditions The LCD shall be inspected under 40W white fluorescent light. 45° 10.2.2 Definition of applicable Zones LCD IC A : Display Area B : Non-Display Area B A (检验条件) (检验条件) LCD应在40W的白色荧光灯下检查 如图法线45度夹角方向观察 可用区域的定义 A:可示区 B:非可示区 Confidential Document Page: 21 / 25 10.2.3 Inspection Parameters No. Parameter Criteria 1 Black or White spots Acceptable number Zone Dimension A B Class Of Defects AQL Level D 0.15 ∗∗ 0.15≤ D 0.24 4 0.2 ≤ D ≤ 0.252 2 D ≤ 0.3 0 1 Minor 2.5 D = (Long + Short) / 2 * : Disregard 2 Scratch, Substances Acceptable number X (mm) Zone Y(mm) A B Class Of Defects AQL Level ∗ 0.04 ≥ W∗∗ 3.0 ≥ L0.06 ≥ W4 4 2.0 ≥ L0.08 ≥ W2 3 ⎯ 0.1 W0 1 Minor2.5 X : Length Y : Width ∗ : Disregard Total defects should not exceed 4/module 3 Air Bubbles (between glass & polarizer) Acceptable number Zone Dimension A B Class of Defects AQL Level D ≤ 0.15 ∗∗ 0.15 D ≤ 0.252 ∗ 0.25 D 0 1 Minor2.5 ∗ : Disregard Total defects shall not excess 3/module. 4 Uniformity of Pixel (1) Pixel shape (with Dent) 0.152 检查参数 判定标准参数项 黑/白点 刮伤,异物 气泡(在玻璃与偏 光片间) 像素形状（凹痕） 像素均匀性 每个模组总的缺陷不能大于3个 每个模组总的缺陷不能大于4个 不计 (长边+短边)/2 缺陷等级允收水准 可接受个数 区域 尺寸 次要缺陷 长 宽 Confidential Document Page: 22 / 25 4 Uniformity of Pixel (2) Pixel shape ( with Projection) Should not be connected to next pixel 0.152 (3) Pin hole X Y ( X + Y )/2 ≤ 0.2mm (Less than 0.1 mm is no counted) (4) Deformation X ( X + Y ) / 2 ≤ 0.3mm Y Total acceptable number : 1/pixel, 5/cell Definition Major AQL 0.65 It is a defect that is likely to result in failure or to reduce materially the usability of the product for the intended function. AQL 1.00 It is a defect that is likely to assembly size and not result in functioning problem. Class of defects Minor AQL 2.5 It is a defect that will not result in functioning problem with deviation classified. 10.3 Sampling Condition Unless otherwise agree in written, the sampling inspection shall be applied to the incoming inspection of customer. Lot size: Quantity of shipment lot per model. Sampling type: normal inspection, single sampling Sampling table: MIL-STD-105E Inspection level: Level II 像素形状（凸起） 凸起物不能连接到相邻的像素 像素均匀性 针孔 小于0.1毫米的不计 畸形 可接受的总数量：每个像素1个缺陷, 每片玻璃最多可接受5个缺陷. 抽样条件 定义 除非客户另有文件规定,客户来料检验使用抽样检验方式 批量大小：每个型号出货批量的数量 抽样类型：正常检验，单次抽样计划 抽样表：MIL-STD-105E 抽样水平：二级 缺陷分类 主缺陷 次缺陷 可能是装配尺寸和不会导致功能问题的缺陷. 不会造成功能问题关于偏差类的缺陷. 是可能导致故障或大大减少产品预期功能的可用性缺陷. 如注释与英文原版有冲突时,请依英文为准. ---周建 2014/7/23 。