aec_q100-011c1
19页1、 AEC - Q100-011 Rev-C1 March 12, 2013 Component Technical Committee Automotive Electronics Council ATTACHMENT 11 AEC - Q100-011 Rev-C1 CHARGED DEVICE MODEL (CDM) ELECTROSTATIC DISCHARGE TEST AEC - Q100-011 Rev-C1 March 12, 2013 Component Technical Committee Automotive Electronics Council Acknowledgment Any document involving a complex technology brings together experience and skills from many sources. The Automotive Electronics Council would especially like to recognize the following significant
2、 contributors to the revision of this document: Charged Device Model ESD Sub-Committee Members: Alan Righter Analog Devices Lynn Norman AMRDEC Wolfgang Reinprecht AMS Ron Wantuck Autoliv Jim Peace Continental Automotive Systems Mark Kelly Delphi Corporation Nick Lycoudes Freescale Michael Stevens Freescale Drew Hoffman Gentex John He Grace Semiconductor Reinhold Gaertner Infineon Technologies Gary Fisher Johnson Controls John Baker Lattice Semiconductor Richard Aburano Maxim C.K. Barlingay Micro
3、chip Nick Martinez Microchip Theo Smedes NXP Semiconductors Zhongning Liang NXP Semiconductors Robert Ashton ON Semiconductor Hugo Van Hove ON Semiconductor Thomas Stich Renesas Electronics Francis Classe Spansion Bassel Atallah STMicroelectronics Marty Johnson Texas Instruments Scott Ward Texas Instruments Larry Dudley TRW Automotive Ted Krueger Vishay Cesar Avitia Visteon Dean Tsaggaris Xilinx Paul Hsueh Xilinx AEC - Q100-011 Rev-C1 March 12, 2013 Component Technical Committee Automotive Elect
4、ronics Council NOTICE AEC documents contain material that has been prepared, reviewed, and approved through the AEC Technical Committee. AEC documents are designed to serve the automotive electronics industry through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for use by those other than AEC members, whether the standard
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