光伏组件pid测试

1、Insert picture here 10 x 17 cm TV SD Greater China TV SD: Partnership adds value Potential Induced Degradation (PID)Service Introduction ?(?)?(PID)? TV SD Content ? Potential Induced Degradation (PID) Background Introduction ?PID? 1 Standards related to Potential Induced Degradation ?PID? ? ? ?PID? 3 What we inspect in Potential Induced Degradation ?PID? 2 7 May 20122 Present ongoing test at lab ?4 Q ? 2.Different wafer resistivity? Increasing the base resistivity leads to more resistant solar c

2、ells concerning PID since lower base doping leads to a wider depletion region at the junction when the emitter doping is held constant. ? ?PID? 1.2.3 cell level ? TV SD 5 May 2009The future is brightSlide 19 ?Emitter sheet resistance ? 1.2.3 cell level ? Fig Emitter sheet resistance dependence of PID ?PID? Increasing the emitter sheet resistance for cell process optimizations leads to a higher sensitivity for degradation of the solar cells and lead to a higher tendency for PID. ? ?PID? Higher sh

3、eet resistance and in general emitter doping is not totally constant over the whole area. The emitter sheet resistance local variations can lead to higher PID sensitivity. ? ?PID? TV SD 5 May 2009The future is brightSlide 20 ?Anti-reflective coating ? 1.Thickness ? Going to thinner ARC layers can be a feasible way of reducing PID. ?Si/N?PID? 2. Ratio of Si to N ? /? ARC layers with higher Si/N ratio can be a feasible way of reducing PID. 3. Homogeneity ? Various SiN deposition methods ?PID? Fig

4、AR-coating: RI, thickness and deposition method dependence of PID ?PID? 1.2.3 cell level ? ?PID? TV SD Solutions for PID ?PID? 5 May 2009The future is brightSlide 21 TV SD 5 May 2009The future is brightSlide 22 ? PID? ? ? ?PID? ? ?, PID?, ? ?PID?,? ? ?, PID? ? ? ? PID? TV SD 5 May 2009The future is brightSlide 23 ?This potential degradation mechanism is not monitored by the typical PV tests listed in IEC 61215 PV?IEC61215?PID? TV SD PID TEST Potential Induced Degradation (PID) Background Introdu

5、ction TV SD Content ? Potential Induced Degradation (PID) Background Introduction ?PID? 1 Standards related to Potential Induced Degradation ?PID? ? ? ?PID? 3 What we inspect in Potential Induced Degradation ?PID? 2 7 May 201224 Present ongoing test at lab ?4 Q One control module; Step 10.1,10.2 and 10.15 refer to IEC 61215 ed.2; Steps MST 01 and MST 13 refer to IEC 61730-2 TV SD 2.3 Samples ? Two representative and identical samples for each polarity of system voltage and one control sample. ?

6、? ?EVA? ? The test results relate only to the sample structure as tested. ? ? 5 May 2009The future is brightSlide 27 TV SD ?PID? ? ? ? EVA? ? ? ? ? ? ? ? ? ? ? 5 May 2009The future is brightSlide 28 2.3 Samples ? TV SD If the module documentation and the nameplate specify usage of the module in strings of only one voltage polarity with respect to earth ground, the number of modules selected for test shall be halved and stressed only in that specified polarity. ? ?2?1? If the PV module is provide

7、d or is specified for use with a specific means for grounding and mounting, then they shall be provided and constitute a part of the test sample. ?PV? ? 5 May 2009The future is brightSlide 29 2.3 Samples ? TV SD 2.4 Marking ? Each module shall carry the following clear and indelible markings: ? ?name, monogram or symbol of manufacturer ? ?type or model number ? ?serial number ? ?polarity of terminals or leads (colour coding is permissible) ? ? ?maximum system voltage for which the module is suitable ? The date and place of manufacture shall be marked on the module or be traceable from the serial number. ? 5 May 2009The future is brightSlide 30 TV SD 2.5 Pass Criteria ? The degradation of maximum output power between initial and final power measurement does not exceed 5%; ?5%? There is no visual evidence of a major defect, as defined in IEC 61215 ed 2 Clause 7; ?IEC61215?2 ?7? The wet lea

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