esd培训手册（PDF 74页）

1、1y9S/ 2005M 4ESD mTowards Zero Defect caused by ESDRev. 1.0 Confidential2Towards Zero Defect Caused by ESDESD mPart I Basic ESD Knowledge 1s ESD $MRev. 1.0 Confidential3Towards Zero Defect Caused by ESDESD What is Electrostatic Discharge (ESD)?A sudden transfer of charge between bodies at differentelectrostatic potentials.Some examples of ESD are:1. Lightning2. The “shock” you sometimes feel during winter when youwalk across the carpet and touch the door knob3. The cracking and sparks when you r

2、emove clothes from yourdryerESD seems harmless, but it can damage electronic components andassemblies Rev. 1.0 Confidential4Towards Zero Defect Caused by ESDESD Ib Electrostatic Discharge (ESD)?8WWyMbESD L1. 2. ?FrvVrZ-_?Cb Latent (Degradation) .?|- This type of damage occurs when an ESD only weakens the components. It may pass initial testing but fail in the field OR fail prematurely. ESD?3d?bVYVK?kV*PrbRev. 1.0 Confidential11Towards Zero Defect Caused by ESDESD Analysis of non-conforming or de

3、fective devices showed that 60-75% were damaged by EOS (electrical overstress) or ESD. This rises to 90% for newer technologies. About 70% of these failures were attributed to damage fromIncorrectly grounded people.JqsAU 60-75%1 ESD EOSb/?Z?X6 90%b 70%r1TbToshikazu Namaguchi, Hideka Uchida.EOS/ESD Symposium EOS-20 1998 pp 245-251Rev. 1.0 Confidential12Towards Zero Defect Caused by ESDESD rLGate Oxide damage under PolysiliconA/ERev. 1.0 Confidential13Towards Zero Defect Caused by ESDESD rLGate Ox

4、ide damage under PolysiliconA/ERev. 1.0 Confidential14Towards Zero Defect Caused by ESDESD THuman Body Model (HBM)8T Machine Model (MM)T Charged Device ModelqTRev. 1.0 Confidential15Towards Zero Defect Caused by ESDHBM THuman Body Model (HBM)8T When a charged individual touches a device, some of the stored energy is transferred or discharged either to the deviceor through the device to ground.B8(qH%irB13L1rbRev. 1.0 Confidential25Towards Zero Defect Caused by ESDCDM TTypical Current Waveform CDM

5、Current / ATime / nsRev. 1.0 Confidential26Towards Zero Defect Caused by ESDP ESDT ESDLH ESDmzReal ESD Spectrum ESD Models Pulse Width sCDMMMRise Time s6HWHBM1110 1010 910 810710910 810Rev. 1.0 Confidential27Towards Zero Defect Caused by ESDHBM S MIL STD 883 D, method 3015.7, 1989 ANSI EOD/ESD S5.1 1993 (ESD Association)ESDx JESD22-A114-B 2000 (JEDEC)Further Standards: EIAJ JapanS CECC EuropeCompany Standardsproduct standards (chip cards: ISO/IEC10373)Rev. 1.0 Confidential28Towards Zero Defect C

6、aused by ESDMM S JESD22-A115-A 1997 under revision (JEDEC) ANSI EOD/ESD S5.2-1999 Automotive Electronics Council- AEC-Q100-003-REV-ERev. 1.0 Confidential29Towards Zero Defect Caused by ESDCDM S ANSI EOS/ESD S5.3 1993 (ESD Association) JESD22-C101 1996 (JEDEC, only for field induced CDM) Automotive Electronics Council-AEC-Q100-011-REV-A(Only for field Induced CDM)Rev. 1.0 Confidential30Towards Zero Defect Caused by ESDUXDamage caused by invisible and undetectable events can be by comparing ESD da

7、mage to medical contamination of human body by virus or bacteria. Although viruses and bacteria are invisible, they can cause severe damage even before you can detect their presence. A defense against this invisible threat is sterilization.ESDE?$Yq81h%)Db5h%)9?F$-/b)BbRev. 1.0 Confidential31Towards Zero Defect Caused by ESDESDMSummary for Part 1 Bsl1. Charges are generated by 2 ways: 3 2oa) Triboeletric Charging 3 b) Induction 2. Type of Damages caused by ESD: ESDa) Catastrophic b) Latent (Degradation) .?/3. The 3 ESD Models are: 3 ESDTa) HBM 8Tb) MM Tc) CDM qT4. Static can be considered as a contamination problemVBU5bRev. 1.0 Confidential32Towards Zero Defect Caused by ESDESD ePart II Concept of ESD Control=s ESDeQRev. 1.0 Confidential33Towards Zero Defect Caused by ESDESD eQMajority of products are designed to serve 3 functionsv ESDe$!9V4/ 3?1) Grounding 2) Isolation 3) Neutralization Rev. 1.0 Confidential34Towards Zero Defect Caused by ESDESD e

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